TXRF Spectrometer – TX 2000
State-of-the-art TXRF Spectrometer TX 2000
TX 2000 is a high precision TXRF Spectrometer ( Total reflection X-Ray Fluorescence)
TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the beam strikes the sample, deposited as a thin layer on a carrier, at a very small incidence angle, in order to exploit enhancement given by the total reflection effect.
- Simultaneous multi-element analysis from Na to Pu
- No matrix effects
- No matrix-dependent calibration curves
- Improved detection limits (LOD) down to ng/g or lower
- Minimum amount of sample
- Microanalysis capabilities
- Stepper motors with optical encoders ensure extremely precise angular values.
- Enhanced excitation mode by selection of the most suitable monochromatized energy (W-La/W-Lb/Mo-Ka) provided by the combination of double anode MO/W X-ray tube and W/Si multilayer. Other X-Ray anodes can be monochromatized as well.
- Peltier-cooled Silicon Drift Detector with an energy resolution better than of 133eV (FWHM@MnKa, 1ms peaking time)
TX 2000 is the state-of-the-art laboratory TXRF spectrometer for quantitative multi element trace analysis using Total Reflection X-Ray Fluorescence (TXRF).
- Stepper motors with optical encoders ensure extremely precise angular values.
- Enhanced excitation mode by selection of the most suitable monochromatized energy (W-La/W-Lb/Mo-Ka) provided by the combination of double anode MO/W X-ray tube and W/Si multilayer. Other X-Ray anodes can be monochromatized as well.
- Peltier-cooled Silicon Drift Detector with an energy resolution better than of 133eV (FWHM@MnKa, 1ms peaking time)
- Minimal distance between the sample and the detector (mounted to the axis normal to the plane of the sample).
- Instrumental detection limits below ng/g.
- Helium flux attachment to improve the detection limits for the light elements.
- No matrix effects
TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the beam strikes the sample, deposited as a thin layer on a carrier, at a very small incidence angle, in order to exploit enhancement given by the total reflection effect. As far as the sample is thin enough (thin film approximation).
TX 2000, equipped with an automatic primary beam switching system (MoKa, WLa/Lb and bremsstrahlung 33 keV), a Silicon Drift Detector (SDD) and a high power X-Ray Tube is the optimal solution for applications in environmental, chemicals and nuclear fields.
| X Ray Generator | |
| Maximum Output Power | 3 kW (option: 4 kW) |
| Max Output Voltage | 60 kV |
| Max Output Current | 60 mA (option: 80 mA) |
| Output Stability | < 0.01 % (for 10% power supply fluctuation) |
| Voltage Step Width | 0.1 kV |
| Current Step Width | 0.1 mA |
| Ripple | 0.03% rms < 1kHz, 0.75% rms > 1kHz |
| Preheat and Ramp | Automatic preheat and ramp control circuit |
| Input Voltage | 220 Vac +/-10%, 50 or 60 Hz, single phase |
| X-Ray Tube (*) | |
| Type | Glass, Mo/W anode, long fine focus |
| Focus | 0.4 x 12 mm |
| Max Output | 2.5 kW (*) Different anodes can be mounted on request |
| Multilayer monochromator | |
| Type | W/Si |
| Reflectivity | 80% |
| Excitation energies | |
| W-La | 8.4 keV (DE<1 keV) |
| W-Lb | 9.67 keV (DE<1 keV) |
| Mo-Ka | 17.44 keV (DE<1 keV) |
| Bremsstrahlung | 33 keV |
| Sample Holder | |
| Sample seating | 12 for TXRF |
| Detector | |
| Type | Peltier-cooled Silicon Drift Detector (SDD) |
| Active Area | 30 mm2 (other sizes available) |
| Resolution | <133 eV (@Mn-Ka, 1ms peaking time) |
| Atmosphere | Air or He Flux |
| Case | |
| Dimensions | Width 580 mm, Height 1631.5 mm, Depth 793 mm |
| Leakage X-Rays | < 1 mSv/Year (full safety shielding according to the international guidelines) |
| Cooling | External Chiller (1146h, 570w, 740d) |
| Software | |
| Acquisition | Selection of excitation energy |
| Measurement batch setup | |
| Detector parameter settings | |
| Analysis | Automatic Least Square Marquardt fit procedure for background determination and peak area calculation |
| Automatic / Manual search Function | |
| Energy calibration refinement | |
| Quantification via an internal standard using theoretical and/or experimental sensitivity curves for total reflection | |
| Possibility of using different sensitivity curves, e.g. sample dependent |
Acquisition Software
Windows software designed for the control of TX 2000 System includes features like batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for scintillation, linear position sensitive detectors and XRF X-GLAB SDD detector are integrated.
Analytical Software
- Least square Marquardt fit procedure for the area calculation (spectral analysis)
- Automatic/manual search function
- Manual or automatic calibration of energy.
- Quantification via an internal standard using theoretical and experimental sensibility curves for total reflection.
- Environmental Analysis: water, dust, sediments, aerosol (ISO/TS 18507:2015, ISO 20289:2018)
- Medical/Pharma: toxic elements in biological fluids and tissue samples, catalyst residues
- Forensic Science: analysis of extremely small sample quantities
- Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
- Oils and greases: crude oil, essential oil, fuel oil, gasoline, jet fuel
- Pigments: ink, oil paints, powder
- Nuclear Industry: measurements of radioactive elements
