Rigaku NEXQC edxrf analyzer
Rigaku Benchtop EDXRF Analyzer NEX QC+
Affordable Benchtop EDXRF analyzer for Elemental Analyzers
Methods: ISO 13032, ASTM D4294, ASTM D6481, ASTM D5059, ASTM D8252, JIS K 2541, IP 336, IP 496, ISO 8754, ISO 20847
- EDXRF analyzer specifically designed for routine quality control applications
- Analyze sodium to uranium non-destructively
- Solids, liquids, alloys, powders, and thin films
- 50 kV X-ray tube
- Minimized X-ray tube wear and tear by operating only during data collection
- Peltier-cooled High-resolution Si Drift Detector(SDD) delivers exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution.
- High Precision and Broad Elemental Coverage
- icon-driven, modern, user-friendly touchscreen user interface for easy operation
- Multiple automated tube filters
- Embedded computer with USB and Ethernet ports
- Convenient built-in thermal printer
- Unmatched performance-to-price ratio
- Autosampler, Helium purge, and fundamental parameters options
Rigaku, the world’s leading manufacturer of analytical X-ray instruments offers the NEX QC series compact, cost-effective solutions for elemental analysis needs. Rigaku NEX QC EDXRF Analyzer is designed for routine quality control applications. Affordable NEX QC series energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid qualitative and quantitative elemental analysis. Non-destructively analyze sodium through uranium in a wide variety of sample types.
EDXRF technology delivers routine elemental measurements across a diverse range of matrices from homogenous liquids of any viscosity to solids metals and alloys coatings and thin films as well as slurries powders and pastes.
A 50 kV X-ray tube and Peltier-cooled solid-state detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. The high voltage capability, along with multiple automated tube filters, provides multi-element analysis capability for unmatched performance and low limits of detection (LOD).
NEX QC Series analyzers are remarkably easy to use.
With the NEX QC series, empirical calibration curves can be linear quadratic or hyperbolic fit in addition to compensate for the presence of other elements. Alpha corrections may be enabled and are automatically calculated. C/H correction is also available to compensate for the light element matrix changes in the oil.
All calibration functions are accessible via intuitive icons and with the touch of a finger. The live spectral display is available during data acquisition.
An easy-to-use touchscreen interface coupled with a powerful embedded computer lowers the cost of ownership because it simplifies operator training and reduces the potential for operator error.
Routine operation is as simple as selecting the measurement application, loading the sample, entering the ID, and pressing start using the touchscreen display.
Results are displayed upon analysis completion. They may be outputted to a built-in thermal printer and stored as a PDF file or via ethernet to the LIMS system.
THE NEX QC series EDXRF analyzers are available in two variations
Low-cost NEX QC
High-resolution NEX QC+
Both instruments employ a 50,000-volt X-ray tube and electrically cooled semiconductor detector technology to deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution.
The enhanced Nex QC Plus has significant improvements in elemental peak resolution and counting statistics, resulting in superior calibrations and precision for the most challenging measurements. NEX QC Plus spectrometer, employing the next-generation silicon detector technology.
Technical Specifications of Rigaku Nex QC+ ED XRF Analyzer
Category | Specification |
General Analysis Capabilities | |
| Technology | Energy Dispersive X-ray Fluorescence (EDXRF) |
| Analytical Range | Sodium (Na) through Uranium (U) |
| Concentration Range | PPM to weight percent levels |
Detection System | |
| Detector Type | High-performance Silicon Drift Detector (SDD) |
| Cooling System | Peltier electronic cooling |
| Features | User configurable shaping times for optimum balance of spectral resolution and count rate |
X-ray System | |
| X-ray Tube | End window type with Ag anode |
| Voltage | 50 kV |
| Maximum Power | 4 W |
| Filter Positions | 6 tube filter positions |
| Operation | X-rays only active during analysis |
Sample Chamber | |
| Chamber Size | 190 x 165 x 60 mm |
| Standard Aperture | Single-position 32 mm sample aperture with leak protection |
| Large Sample Support | 17.5 mm ID flat sample ring |
User Interface | |
| Display | 8″ WVGA touchscreen interface |
| Computer | Embedded computer with LINUX® operating system |
| Printer | Internal thermal printer |
| Connectivity | USB and Ethernet connections |
Software Capabilities | |
| Interface | Icon-driven graphical user interface |
| Analysis Features | • Qualitative and quantitative analysis • Single or dual point standardization • 6 pre-configured validation schemes • User-configurable repeat analysis • Live results update • Analysis Complete Remove Sample warning |
| Data Management | • Data export function with LIMS capability • Application method export/import to USB or network folder • Password protection • Multi-language support |
Optional Features | |
| Helium Purge | • Flow rate: 0.2 L/min (during analysis only) • Helium purity: 99.95% • Tubing: 6 mm OD x 4 mm ID, 10 meters |
| Sample Handling Options | • Single-position 40 mm sample aperture • Single-position 32 mm sample spinner • 6-position automatic sample changer (32 mm samples) • 5-position automatic sample changer (35 – 40 mm samples) |
| Power Backup | • Uninterruptible power supply (UPS) • 865 W / 1500 VA battery backup • Transient surge protection |
Power Requirements | |
| Input Power | Single phase AC 100 – 240 V, 1.4 A (50/60 Hz) |
Environmental Requirements | |
| Operating Temperature | 10 – 35°C (50 – 95°F) |
| Relative Humidity | ≤85% non-condensing |
| Environment | – Vibration undetectable by human<br>- Free from corrosive gas, dust and particles |
Warranty | |
| Duration | 2-year manufacturer’s warranty |
Physical Specifications | |
| Dimensions | 331 (W) x 432 (D) x 376 (H) mm (13 x 17 x 14.8 in) |
| Weight | 16 kg (35 lbs) |
Software Features of Rigaku ED XRF analyzer Nex QC+
- Icon-driven graphical user interface
- Simple flow bar wizard to create new applications
- Qualitative and quantitative analysis
- Single or dual point standardization
- 6 pre-configured validation schemes with user defined bounds
- User-configurable repeat analysis
- Live results update
- Analysis Complete Remove Sample warning feature
- Data export function with LIMS capability
- Application method export/import to USB or network folder
- Password protection
- Multi-language
Applications of Rigaku NEX QC+ ED XRF Analyzer
Industry/Field | Applications/Uses |
| Catalysts | * Analysis of heterogeneous and homogeneous catalysts for heavy metal content |
| * Determination of stoichiometry | |
| * Quantification of poisoning agents | |
| * Precious metals content analysis in recycled automotive catalysts | |
| Cement | * Quality control measurements in cement plants |
| * Analysis of clinker and raw meal | |
| * Measurement of gypsum (SO3) in finished cement | |
| * Backup to WDXRF systems | |
| Coatings | * Analysis of silicone coatings on paper and plastic |
| * Release coating analysis in tape manufacture | |
| * Barrier coating analysis for food packaging | |
| * Quantification of metallic coatings (electroplated or sputtered) | |
| Cosmetics | * Analysis of Ti and Zn oxides as UV blockers |
| * Analysis of Fe, Ti, and Zn oxides as pigments | |
| * Screening for toxic metals | |
| * Inspection of incoming raw materials | |
| Education | * Teaching atomic spectroscopy principles |
| * Laboratory instrumentation training | |
| * Support for physics and chemistry classroom instruction | |
| Geology | * Rock and mineral sample composition analysis |
| * Analysis of limestone | |
| * Analysis of kaolin clay | |
| * Analysis of silica sand | |
| Metals and Alloys | * Classification of alloys |
| * Production control | |
| * Verification of alloy designation | |
| * Iron analysis in aluminum alloys | |
| * Jewelry analysis (with VS option) | |
| Mining and Refining | * Analysis of ores |
| * Analysis of feeds | |
| * Analysis of slags | |
| * Analysis of tails | |
| * Backup analyzer for continuous production | |
| Paint and Pigments | * Analysis of metal dyes |
| * Analysis of opacifiers | |
| * Analysis of inorganic stabilizers | |
| * Titanium dioxide analysis in white road paint | |
| * Lead chromate analysis in yellow road paint | |
| * Forensic identification of paint chips | |
| Petroleum | * Heavy elements analysis in crude oil |
| * Sulfur analysis in fuels | |
| * Analysis of elements in lubricating oils | |
| * Sulfur analysis in crude oil, bunker fuel, and ULSD | |
| * Compliance testing (ASTM D4294, ISO 20847, 8754, IP 496, 336, JIS K 2541*4, ISO 13032) | |
| Plastics | * Analysis of Br and Sb as fire retardants |
| * Analysis of stabilizers and lubricants (P, Ca, Ba, Zn) | |
| * Analysis of Mg, Al, Si, Fe in fiberglass | |
| * Analysis of S in polyurethane | |
| RoHS Compliance | * Heavy metal toxin analysis (Pb, Cd, Hg, hexavalent chromium) |
| * Consumer goods compliance testing | |
| * Electronics compliance testing | |
| Wood | * Analysis of chemical preservatives |
| * CCA treatment analysis | |
| * IPBC treatment analysis | |
| * PENTA treatment analysis | |
| * Copper treatment analysis (CA*B, CA*C) | |
| * ACZA treatment analysis | |
| Wovens and Non-wovens | * Analysis of fire retardants |
| * Analysis of UV stabilizers | |
| * Analysis of anti*microbial treatments | |
| * Analysis of electromagnetic shielding |
