APD 2000 PRO for Phase and Structural analysis of Powder Samples
Powder X-Ray Diffractometer APD 2000 PRO
APD 2000 PRO Diffractometer is designed to be the best solution for the phase and structural analysis of powder samples. A powerful tool for powder diffraction applications such as routine qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation.
- Qualitative and Quantitative Powder X-Ray Diffractometer
- High Stability X-Ray generator through precision feedback control circuits
- The automatic ramp of the high voltage and emission current to pre-set values
- Ceramic X-ray tubes with high reproducibility and stability of focus position
- Microfocus tubes and policapillary collimators
- Possibility of changing automatically from transmission to reflection mode
- High precision, high-speed goniometer controlled by optical encoders
- Traditional, rotating, multi-sample and capillary sample holders
- Scintillation counters, silicon strip and energy dispersive detectors
- Non-ambient analysis, low and high-temperature chambers, humidity device
APD 2000 PRO diffractometer is a high power – Theta/2Theta – laboratory powder X-Ray Diffractometer offer high accuracy, precision, safety and ease of use for XRD analysis of polycrystalline materials. ADP 2000 is optimized for phase and structural analysis of powder samples.
Wide range of configurations and accessories such as
- High-speed detector
- Scintillation counter
- High-low temperature and humidity chamber
- Secondary monochromator
- Spinner and multiple sample holder
APD 2000 PRO is a powerful tool for powder diffraction applications such as routine qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation.
- High Speed Rate (1000°/min)
- High Precision Angle Reproducibility (+/- 0.0001°)
- Fast Measurement and Highly Reliable Data
- Extremely precise angular values thanks to stepper motors with optical encoders
- Easy to handle
| X-Ray Generator | |
| Maximum Output Power | 3 kW (option: 4 kW) |
| Output Stability | < 0.01 % (for 10% power supply fluctuation) |
| Max Output Voltage | 60 kV |
| Max Output Current | 60 mA (option: 80 mA) |
| Voltage Step Width | 0.1 kV |
| Current Step Width | 0.1 mA |
| Ripple | 0.03% rms < 1kHz, 0.75% rms > 1kHz |
| Preheat and Ramp | Automatic preheat and ramp control circuit |
| Input Voltage | 220 Vac +/-10%, 50 or 60 Hz, single phase |
| Size | Width 48.3 cm, height 13.3 cm, depth 56 cm |
| X-Ray Tube | |
| Type | Glass (option: Ceramic), Cu Anode, Fine Focus (options: any kind of X-Ray tube) |
| Focus | 0.4 x 12 mm LFF (other options available) |
| Max Output | 3.0 kW |
| Goniometer | |
| Configurations | Vertical and Horizontal Theta/2Theta geometry |
| Measuring circle diameters | 350 – 400 mm |
| Vertical Scanning Angular Range | – 60° < 2 Theta < + 168° (according to accessories) |
| Horizontal Scanning Angular Range | – 110° < 2 Theta < + 168° (according to accessories) |
| Smallest selectable step size | 0.0001° |
| Angular reproducibility | +/- 0.0001° |
| Modes of operation | Continuous scan, step scan, theta or 2 theta scan, fast scan, theta axis oscillation |
| Variable Divergence slits | 0 – 4° |
| Variable Anti-Divergence slits | 0 – 4° |
| Variable Receiver slits | 0 – 4° |
| Soller slits | 2° |
| Detector | |
| Type | Scintillation counter Nal (options: YAP(Ce); multistrip) |
| Countrate | 2 x 10(6) cps (Nal); 2 x 10(7) cps (Yap(Ce)) |
| Processing Unit | |
| Computer Type | Personal Computer, the latest version |
| Items controlled | X-ray generator, goniometer, sample holder, detector, counting chain |
| Basic Data Processing | Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation |
Data Collection Programs
GNR offers a large variety of acquisition programs for standard as well as for customized hardware configurations. List includes programs for powder and high-resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD).
SAX
- Single peak analysis.
- peak treatment.
- Background subtraction, smoothing, deconvolution and peak localisation.
- Structural Analysis
- Crystallite Size
- Lattice Strain
- Reflectometry
- Quantitative Analysis.
Search and Match: MATCH!
- Rietveld refinement
- Display and compare multiple diffraction partners
- Directly view specific phases/entries
- Instant usage of additional information
- Saving of selection criteria
- Comfortable definition of background
- Improved zooming facilities
- Batch processing and Automatics.
Qualitative and quantitative phase analysis, non-ambient analysis, retained austenite quantification, structure solution and refinement, crystallite size and crystallinity calculations.
- Geology and Mineralogy / Clays
- Glass / Ceramics / Cement
- Chemicals / Petrochemicals
- Catalyst / Polymers
- Forensics
- Agricultural Sciences
- Biosciences / Environmental
- Pharmaceuticals
- Cosmetics
- Art and Archaeology
